{"product_id":"high-resolution-x-ray-diffractometry-and-topography-paperback","title":"High Resolution X-Ray Diffractometry And Topography - Paperback","description":"\u003cp\u003eby \u003cb\u003eD. K. Bowen\u003c\/b\u003e (Author), \u003cb\u003eBrian K. Tanner\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eThe rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.\u003c\/p\u003e\u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 264\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.7 x 9.5 x 6.8 IN\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e October 10, 2019\u003c\/div\u003e","brand":"Books by splitShops","offers":[{"title":"Default Title","offer_id":51773631201568,"sku":"9780367400637","price":153.88,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0974\/9764\/5344\/files\/42194e6e597905aaf97d5c7525c278d3_1f098fed-d8ef-41fa-bb30-f2fe727c558d.webp?v=1780429436","url":"https:\/\/ebocreations.com\/products\/high-resolution-x-ray-diffractometry-and-topography-paperback","provider":"The E-Book Oasis LLC","version":"1.0","type":"link"}